TECPS 2017- Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems

Full Citation in the ACM Digital Library

SESSION: Papers

Discovering instructions for robust binary-level coverage criteria

• Vaibhav Sharma
• Taejoon Byun
• Stephen McCamant
• Sanjai Rayadurgam
• Mats P. E. Heimdahl

Testing uncertainty of cyber-physical systems in IoT cloud infrastructures: combining model-driven engineering and elastic execution

• Hong-Linh Truong
• Luca Berardinelli

Fault injection in the internet of things applications

• Mohammad Amin Alipour

Towards automated composition of heterogeneous tests for cyber-physical systems

• Alex Groce
• Paul Flikkema
• Josie Holmes